Click on image to view larger version.



Fig. 3. Flowchart used for calculating the reflectivities Rt from the in situ measured profiles {theta}i,t and Ti,t. (Subscript i refers to layer i and t to time; {epsilon}h,tapp is defined by Eq. [10]; {theta}2,t is the water content at 2 cm; h is the roughness parameter.)