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Published online 24 August 2006
Published in Vadose Zone J 5:1048-1064 (2006)
DOI: 10.2136/vzj2006.0009
© 2006 Soil Science Society of America
677 S. Segoe Rd., Madison, WI 53711 USA
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Laboratory Characterization of a Commercial Capacitance Sensor for Estimating Permittivity and Inferring Soil Water Content

Mike Schwanka,*, Timothy R. Greenb, Christian Mätzlerc, Hansruedi Benedickterd and Hannes Flühlere

a Institute of Terrestrial Ecosystems (ITES), Swiss Federal Institute of Technology (ETH), CHN E29, Universitätstr. 16, CH-8092 Zürich, Switzerland
b USDA-ARS, Great Plains Systems Research Unit, Fort Collins, CO, USA
c Institute of Applied Physics, University of Bern, Sidlerstrasse 5, CH-3012 Bern, Switzerland
d Laboratory for Electromagnetic Fields and Microwave Electronics, ETHZ, ETZ K 88, Gloriastrasse 35, CH-8092 Zürich, Switzerland
e Institute of Terrestrial Ecosystems (ITES), Swiss Federal Institute of Technology (ETH), CHN F 28.1, Universitätstr. 16, CH-8092 Zürich, Switzerland


Figure 1
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Fig. 1. (a) Installation of the access tube in the field; (b) EnviroSMART soil water content probe with capacitance sensors; (c) sensor with symbolized field lines; (d) sensor electronic board; and (e) equivalent circuit diagram. The dashed line in (e) represents the sensor electronics board, neglecting capacitors and resistors on the board.

 

Figure 2
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Fig. 2. Sketch of the solvent-resistant container with the tools used. The heater, dielectric probe, the thermometer, and the tools for removing air bubbles from the access tube and the dielectric probe are retracted during the capacitive measurements and the sensor readings. Dimensions are not to scale.

 

Figure 3
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Fig. 3. Picture of the experimental setup used for characterizing the EnviroSMART soil water content sensor.

 

Figure 4
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Fig. 4. Cylindrical metal sheet disturbance used for investigating the sampling volume of the sensor.

 

Figure 5
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Fig. 5. Rotation symmetrical model setup used for simulating the electric field E caused by a potential difference between the ring electrodes of the sensor. Capacitance C is calculated from the field distribution E.

 

Figure 6
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Fig. 6. Sensor responses fr–2 to surface mounted device (SMD) added capacitance CSMD with and without the ring capacitor attached to the instrument.

 

Figure 7
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Fig. 7. Measured relation between permittivity of the dioxane–water mixture outside the access tube and normalized sensor reading N. The light gray data are the laboratory measurements; the data represented by the black circles are corrected for the calculated effect {Delta}N({varepsilon}) of the fluorinated ethylene-propylene (FEP) coating. The solid lines are the approximations using Eq. [29] and {sigma} is the standard deviation between Nik measured with the sensors k = 1 to 4.

 

Figure 8
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Fig. 8. Measured sensor capacitance C versus permittivity {varepsilon} of the dioxane–water mixture outside the access tube.

 

Figure 9
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Fig. 9. Electric field strength |E| resulting from the potential difference U = 2 V between the ring electrodes calculated using permittivities of access tube, electrode holder, and environmental material of {varepsilon}acc = {varepsilon}hold = 3.35 and {varepsilon} = 20, respectively.

 

Figure 10
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Fig. 10. (a) Modeled and measured capacitances Cmodel and Cexp between the ring electrodes as a function of the permittivity {varepsilon} of the environmental material. The permittivity of the access tube and sensor holder are {varepsilon}acc = {varepsilon}hold = 3.35. (b) Modeled normalized sensor readings Nmodel and normalized readings Nexp measured in the laboratory (with the FEP shrink tube on the access tube) together with the interpolation function {varepsilon}(Nexp).

 

Figure 11
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Fig. 11. (a) Calculated sensor capacitances Cmodel with FEP({varepsilon}) and Cmodel without FEP({varepsilon}) for the case where the access tube is coated (hollow circles) and not coated (solid squares) with the 0.5 mm thick the FEP shrink fit with permittivity {varepsilon}FEP = 2. (b) Normalized sensor readings Nmodel with FEP({varepsilon}) and Nmodel without FEP({varepsilon}) derived from Cmodel, with FEP({varepsilon}) and Cmodel, without FEP({varepsilon}) using Eq. [11] for the case with (hollow circles) and without (solid squares) the shrink fit on the access tube.

 

Figure 12
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Fig. 12. (a) Difference {Delta}C({varepsilon}) between simulated capacitances Cmodel with FEP({varepsilon}) with the FEP coating on the access tube and Cmodel without FEP({varepsilon}) without the FEP coating taken from Fig. 11a. (b) Difference {Delta}N({varepsilon}) between corresponding sensor readings Nmodel with FEP({varepsilon}) and Nmodel without FEP({varepsilon}) taken from Fig. 11b.

 

Figure 13
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Fig. 13. (a) Temperature dependency {varepsilon}w(T) of the permittivity of pure water ({phi}d = 0) measured with the VNA dielectric sensor (solid dots) and derived from the capacitance sensor readings (hollow circles). (b) Temperature dependencies {varepsilon}d(T) and {varepsilon}dw98(T) of pure dioxane ({phi}d = 1, hollow squares) and a solution with {phi}d = 0.98 (hollow diamonds) deduced from the capacitance sensor readings.

 

Figure 14
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Fig. 14. Normalized sensor reading N versus distance D between the access tube and the metal sheet: (a) measured at 10 distances up to D = 96.3 mm for {varepsilon} = ({varepsilon}a = 1, 16.4, 20.3, {varepsilon}w = 78.38); and (b) N(D) calculated from the electromagnetic model. The distance D between the access tube and the metallic cylinder is varied between 0 and 162 mm, and the permittivity {varepsilon} was between the air and the water value. The solid lines are the best fits with the exponential model (Eq. [23]).

 

Figure 15
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Fig. 15. Electric field strength |E| resulting from the potential difference U = 2 V between the ring electrodes calculated using the model configuration with the metal foil disturbance at distance D = 27 mm from the access tube ({varepsilon}acc = {varepsilon}hold = 3.35 and {varepsilon} = 20).

 

Figure 16
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Fig. 16. Comparison between the default calibration proposed by the vendor (Sentek) and three different dielectric mixing models (Topp et al., 1980; Roth et al., 1990; Wang and Schmugge, 1980) with respect to: (a) the water content {theta}[{varepsilon}(N)] calculated using relation [29] for {varepsilon}(N) and (b) water content–permittivity relationships {varepsilon}({theta}).

 





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