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Fig. 3. Flowchart used for calculating the reflectivities R_t from the in situ measured profiles ${theta}$ _i_,_t and T_i_,_t. (Subscript i refers to layer i and t to time; ${epsilon}$ _h,t^app is defined by Eq. [10]; ${theta}$ _2,_t is the water content at 2 cm; h is the roughness parameter.)